Quantitative Imaging of Sheet Resistance with a Scanning Near-Field Microwave Microscope - D. E. Steinhauer, C. P. Vlahacos, S. K. Dutta, B. J. Feenstra, F. C. Wellstood

Quantitative Imaging of Sheet Resistance with a Scanning Near-Field Microwave Microscope - D. E. Steinhauer, C. P. Vlahacos, S. K. Dutta, B. J. Feenstra, F. C. Wellstood | Arena