A Practical Finite Element Approach for Simulating Dynamic Crack Growth in Cu/Ultra Low-k Interconnect Structures - Yuxi Xie, Ethan J. Wu, Lu Xu, Jimmy Perez, Shaofan Li

A Practical Finite Element Approach for Simulating Dynamic Crack Growth in Cu/Ultra Low-k Interconnect Structures - Yuxi Xie, Ethan J. Wu, Lu Xu, Jimmy Perez, Shaofan Li | Arena